MarSurf3D | 3D surface measurement

MarSurf3D CM plus explorer 100

Art. no. 6350027

The new MarSurf CM explorer-series is the ultimate confocal microscope for the accurate three-dimensional measurement and analysis of surfaces – non-contact, independent of material, and fast.

MarSurf3D CM <i>plus explorer</i> 100<br/>
Flexible all-round measuring solution

The powerful MarSurf CM devices stand for reliable measurement on all surfaces - they offer users high resolution with maximum robustness, edge acceptance and dynamics.
In addition, the state-of-the-art tools allow ultra-fast measurements (up to 4x faster than before) with a high measurement point density, which ensure high-quality and unfiltered raw data.
By selecting the CM explorer or CM plus explorer variant for the highest demands, the system can be adapted to your application with up to 2x better repeatability and measurement uncertainty.

Typical measuring tasks
  • Roughness measurements as per
    ISO 21920 / 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, repeatability, reproducibility and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design and quality control areas etc.
MarSurf3D CM plus explorer 100
| β„– Π΄Π΅Ρ‚Π°Π»ΠΈ 6350027
ΠšΡ€Π°Ρ‚Π½ΠΎΡΡ‚ΡŒ увСличСния ΠΎΠ±ΡŠΠ΅ΠΊΡ‚ΠΈΠ²Π° 5x - 100x
макс. масса ΠΎΠ±Ρ€Π°Π·Ρ†Π° 10 kg
Π˜ΡΡ‚ΠΎΡ‡Π½ΠΈΠΊ свСта High-performance LED (505 nm / white)
Высота ΠΎΠ±Ρ€Π°Π·Ρ†Π° (макс.) 70 mm (on request)
ΠŸΠΎΠ²Π΅Ρ€Ρ…Π½ΠΎΡΡ‚ΡŒ ΠΎΠ±Ρ€Π°Π·Ρ†Π° Reflectivity 0.1 - 100% coated, uncoated, reflective to diffuse
Π¨ΡƒΠΌ ΠΏΡ€ΠΈ ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠΈ (ΠΏΡŒΠ΅Π·ΠΎΠΏΡ€ΠΈΠ²ΠΎΠ΄) 1 nm
Π¨ΡƒΠΌ ΠΏΡ€ΠΈ ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠΈ (Π±Π»ΠΎΠΊ позиционирования) 5 nm
Π—ΠΎΠ½Π° позиционирования ΠΏΠΎ оси x 100 mm
Π—ΠΎΠ½Π° позиционирования ΠΏΠΎ оси y 100 mm
Π—ΠΎΠ½Π° позиционирования ΠΏΠΎ оси z 70 mm
Π―Π·Ρ‹ΠΊΠΈ НСмСцкий , Английский , Ѐранцузский , Π˜Ρ‚Π°Π»ΡŒΡΠ½ΡΠΊΠΈΠΉ , Испанский , ΠŸΠΎΡ€Ρ‚ΡƒΠ³Π°Π»ΡŒΡΠΊΠΈΠΉ , Польский , Русский , Π’ΡƒΡ€Π΅Ρ†ΠΊΠΈΠΉ , ΠšΠΈΡ‚Π°ΠΉΡΠΊΠΈΠΉ , Японский , ΠšΠΎΡ€Π΅ΠΉΡΠΊΠΈΠΉ
Π Π°ΡΡˆΠΈΡ€Π΅Π½ΠΈΠ΅ Π·ΠΎΠ½Ρ‹ позиционирования ΠΏΠΎ осям x, y, z Extenstion z-positioning volume on request

Variety of applications for our products

Mechanical Engineering
To qualify and quantify roughness, geometry and wear volume

Electronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free products

Medical Technology
Quality assurance of medical surfaces in production and laboratory

Material Science
Optimization of functional properties of new surfaces and products

Microsystems Technology
Measure complex surface geometries of smallest components with nanometer precision
ΠŸΡ€Π°Π²ΠΈΠ»ΡŒΠ½ΠΎΠ΅, воспроизводимоС ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠ΅
Your measuring data is recorded reliably, can be replicated, and guarantees the highest quality of raw data and profile accuracy.
Π¨ΠΈΡ€ΠΎΠΊΠΈΠΉ Π΄ΠΈΠ°ΠΏΠ°Π·ΠΎΠ½ ΠΎΠ±Ρ€Π°Π±Π°Ρ‚Ρ‹Π²Π°Π΅ΠΌΡ‹Ρ… Π΄Π΅Ρ‚Π°Π»Π΅ΠΉ
Material-independent measurement of any geometries and surface characteristics regardless of whether they are reflective, absorbent, opaque or transparent.
Π˜Π½Ρ‚ΡƒΠΈΡ‚ΠΈΠ²Π½ΠΎΠ΅ ΡƒΠΏΡ€Π°Π²Π»Π΅Π½ΠΈΠ΅
Simple, user-guided interface with automatic modes for all significant measuring parameters, including use of measurement protocols for known surfaces.
To top