MarSurf3D | Π’Ρ€Π΅Ρ…ΠΌΠ΅Ρ€Π½ΠΎΠ΅ ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠ΅ повСрхности

MarSurf3D CM explorer

Art. no. 6350000

Flexible all-round measuring solution

The MarSurf CM explorer is a compact confocal microscope for the accurate three-dimensional measurement and analysis of surfaces – non-contact, independent of material, and fast.

MarSurf3D CM <i>explorer</i>
MarSurf3D CM <i>explorer</i>
Flexible all-round measuring solution

The MarSurf CM explorer is suitable for use in test laboratories and equipped for quality assurance in production environments due to its robust construction and insensitivity to environmental influences.
Typical measuring tasks
  • Roughness measurements as per
    ISO 4287 & ISO 13565 / ISO 25178
  • Topography measurements (including volume, wear, tribology)
  • contour and form (2D, 3D)
  • pore, particle analysis
  • defect detection
  • ...
Maximum data quality

One of our most important criteria, which equates to excellent precision, accuracy, repeatability, reproducibility and documentation to ensure traceability and auditability. Our greatest service for the customer is to provide a quantitative measuring value that can be implemented reliably in the engineering, product, process design and quality control areas etc.

Variety of applications for our products

ΠœΠ°ΡˆΠΈΠ½ΠΎΡΡ‚Ρ€ΠΎΠ΅Π½ΠΈΠ΅
ΠšΠ°Ρ‡Π΅ΡΡ‚Π²Π΅Π½Π½Π°Ρ ΠΈ количСствСнная ΠΎΡ†Π΅Π½ΠΊΠ° ΡˆΠ΅Ρ€ΠΎΡ…ΠΎΠ²Π°Ρ‚ΠΎΡΡ‚ΠΈ, Π³Π΅ΠΎΠΌΠ΅Ρ‚Ρ€ΠΈΠΈ ΠΈ объСмного износа  

ЭлСктронная ΠΈ полупроводниковая ΠΏΡ€ΠΎΠΌΡ‹ΡˆΠ»Π΅Π½Π½ΠΎΡΡ‚ΡŒ
ΠŸΡ€ΠΎΠ²Π΅Ρ€ΠΊΠ° ΠΊΠΎΠΌΠΏΠΎΠ½Π΅Π½Ρ‚ΠΎΠ² Π²ΠΏΠ»ΠΎΡ‚ΡŒ Π΄ΠΎ субмикромСтрового Π΄ΠΈΠ°ΠΏΠ°Π·ΠΎΠ½Π° для Π±Π΅Π·Π΄Π΅Ρ„Π΅ΠΊΡ‚Π½Ρ‹Ρ… ΠΈΠ·Π΄Π΅Π»ΠΈΠΉ

ΠœΠ΅Π΄ΠΈΡ†ΠΈΠ½ΡΠΊΠ°Ρ Ρ‚Π΅Ρ…Π½ΠΈΠΊΠ°
ΠšΠΎΠ½Ρ‚Ρ€ΠΎΠ»ΡŒ качСства повСрхности мСдицинских ΠΈΠ·Π΄Π΅Π»ΠΈΠΉ Π½Π° производствС ΠΈ Π² лабораториях

ΠœΠ°Ρ‚Π΅Ρ€ΠΈΠ°Π»ΠΎΠ²Π΅Π΄Π΅Π½ΠΈΠ΅
ΠžΠΏΡ‚ΠΈΠΌΠΈΠ·Π°Ρ†ΠΈΡ Ρ„ΡƒΠ½ΠΊΡ†ΠΈΠΎΠ½Π°Π»ΡŒΠ½Ρ‹Ρ… свойств Π½ΠΎΠ²Ρ‹Ρ… повСрхностСй ΠΈ ΠΈΠ·Π΄Π΅Π»ΠΈΠΉ

ΠœΠΈΠΊΡ€ΠΎΡΠΈΡΡ‚Π΅ΠΌΠ½Π°Ρ тСхнология
Π˜Π·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠ΅ слоТной Π³Π΅ΠΎΠΌΠ΅Ρ‚Ρ€ΠΈΠΈ повСрхности ΠΌΠ΅Π»ΡŒΡ‡Π°ΠΉΡˆΠΈΡ… ΠΊΠΎΠΌΠΏΠΎΠ½Π΅Π½Ρ‚ΠΎΠ² с Ρ‚ΠΎΡ‡Π½ΠΎΡΡ‚ΡŒΡŽ Π΄ΠΎ Π½Π°Π½ΠΎΠΌΠ΅Ρ‚Ρ€Π°
ΠŸΡ€Π°Π²ΠΈΠ»ΡŒΠ½ΠΎΠ΅, воспроизводимоС ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠ΅
Π”Π°Π½Π½Ρ‹Π΅ ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠΉ Π½Π°Π΄Π΅ΠΆΠ½ΠΎ Ρ€Π΅Π³ΠΈΡΡ‚Ρ€ΠΈΡ€ΡƒΡŽΡ‚ΡΡ ΠΈ ΠΌΠΎΠ³ΡƒΡ‚ Π±Ρ‹Ρ‚ΡŒ воспроизвСдСны. ΠšΡ€ΠΎΠΌΠ΅ Ρ‚ΠΎΠ³ΠΎ, Π³Π°Ρ€Π°Π½Ρ‚ΠΈΡ€ΡƒΡŽΡ‚ΡΡ Π²Ρ‹ΡΠΎΡ‡Π°ΠΉΡˆΠ΅Π΅ качСство исходных Π΄Π°Π½Π½Ρ‹Ρ… ΠΈ Ρ‚ΠΎΡ‡Π½ΠΎΡΡ‚ΡŒ профиля.
Π¨ΠΈΡ€ΠΎΠΊΠΈΠΉ Π΄ΠΈΠ°ΠΏΠ°Π·ΠΎΠ½ ΠΎΠ±Ρ€Π°Π±Π°Ρ‚Ρ‹Π²Π°Π΅ΠΌΡ‹Ρ… Π΄Π΅Ρ‚Π°Π»Π΅ΠΉ
Material-independent measurement of any geometries and surface characteristics regardless of whether they are reflective, absorbent, opaque or transparent.
Π˜Π½Ρ‚ΡƒΠΈΡ‚ΠΈΠ²Π½ΠΎΠ΅ ΡƒΠΏΡ€Π°Π²Π»Π΅Π½ΠΈΠ΅
ΠŸΡ€ΠΎΡΡ‚ΠΎΠΉ ΠΏΠΎΠ»ΡŒΠ·ΠΎΠ²Π°Ρ‚Π΅Π»ΡŒΡΠΊΠΈΠΉ интСрфСйс с автоматичСскими Ρ€Π΅ΠΆΠΈΠΌΠ°ΠΌΠΈ для всСх Π·Π½Π°Ρ‡ΠΈΠΌΡ‹Ρ… ΠΏΠ°Ρ€Π°ΠΌΠ΅Ρ‚Ρ€ΠΎΠ² ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠΉ, Π² Ρ‚ΠΎΠΌ числС использованиС ΠΏΡ€ΠΎΡ‚ΠΎΠΊΠΎΠ»ΠΎΠ² ΠΈΠ·ΠΌΠ΅Ρ€Π΅Π½ΠΈΠΉ для извСстных повСрхностСй.
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