MarSurf | Contour measuring station

MarSurf CD 140 AF

์ œํ’ˆ๋ฒˆํ˜ธ 6269053

Contour measuring system with flexible clamping device stand and roughness option (without PC)

MarSurf CD 140 AF
Speedy measurements
  • Short measuring times thanks to high positioning and measuring speeds
  • Space-saving measuring station for fast contour measurement
  • Quickly change the probe arm without tools thanks to a magnetic mount โ€“ no recalibration required
  • Measuring force selection prevents measurement errors


Flexible and versatile
  • Workpiece support plate with 25ย mm travel path
  • Large measuring range of 70ย mm for versatile use
  • Maximum handling flexibility thanks to support plate with 50ย mm bore dimension
  • Wide selection of probe arms and accessory parts

Comprehensive software package
  • Measurement of double contours e.g., for determining diameters
  • Optional roughness measurement from Rzย 2ย ยตm possible
  • Simple and intuitive contour measurement and evaluation
  • Start Quick & Easy programs by importing DMC codes

MarSurf CD 140 AF | ํ’ˆ๋ชฉ ๋ฒˆํ˜ธ 6269053
ํ•ด์ƒ๋„ 20 nm
์ธก์ •๋ ฅ(N) 4 mN to 30 mN, software adjustable
์ธก์ • ์†๋„ 0.1 mm/s - 10 mm/s
์œ„์น˜ ์ด๋™ ์†๋„(mm/s), X์ถ• 0.1 - 200 mm/s
ํ”„๋กœ๋ธŒ Contour tracing system
์ธก์ •๋ฌผ ๋ฌด๊ฒŒ(์ตœ๋Œ€) (kg) 1.5 kg
๊ธฐํƒ€ machine weight: 35 kg
์ธก์ • ๋ฒ”์œ„ mm 70 mm with probe arm length 350 mm
์„ธ๋ถ€์‚ฌํ•ญ
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